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ROHM Expands High-Accuracy EROM Models for Shunt Resistors

Now Standard in Siemans’ Flotherm™

Comparison Between EROM Model and Average of Measured Values

ROHM's EROM models achieve high accuracy with a measurement deviation within ±5% for both surface temperature (ΔT) and thermal resistance.
ROHM’s EROM models achieve high accuracy with a measurement deviation within ±5% for both surface temperature (ΔT) and thermal resistance.

Santa Clara, CA and Kyoto, Japan, Nov. 20, 2025 (GLOBE NEWSWIRE) — ROHM Semiconductor today announced its expanded lineup of EROM (Embeddable BCI-ROM) models for shunt resistors now available on ROHM’s website. In addition, these models are now standard in Siemens’ electronic thermal design software, Simcenterâ„¢ Flothermâ„¢*.

ROHM’s shunt resistors are widely used in automotive and industrial equipment applications, where their high-accuracy current detection and superior reliability are highly valued. We have added the PMR series to the EROM lineup, alongside the previously available PSR series.

The EROM models achieve high accuracy with a measurement deviation within ±5% for both surface temperature (ΔT) and thermal resistance, enabling thermal analysis that closely reflects actual operating conditions. This contributes to improved simulation accuracy in the thermal design phase and enhances overall development efficiency.

Furthermore, by standard implementation in Simcenterâ„¢ Flothermâ„¢, these models make it easier for component manufacturers and set manufacturers to share thermal analysis data. This allows for highly accurate and efficient simulations while maintaining the confidentiality of proprietary information.

Going forward, ROHM will continue to enhance the support for customers’ design and development activities through both its high-performance components and advanced simulation models.
*Standard in Simcenterâ„¢ Flothermâ„¢ 2510 and later.

Application Note
How to Use Thermal Simulation Models: PSR series / PMR series

Contact ROHM for more information.

Attachment

  • Comparison Between EROM Model and Average of Measured Values
CONTACT: Heike Mueller
ROHM Semiconductor
+1-408-720-1900
[email protected]

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